A
- 6DOF MachinesA-weightingA/D ConverterAbsoluteAbsolute AccuracyAbsolute VibrationAbsorberAccelerated Life TestingAccelerated Stress TestingAccelerationAccelerometerAccessibilityAccuracyAdvanced Product Quality Planning and Control Plan (APQP/CP)Aggravated TestAliasingAlignmentAmbient EnvironmentAmplitudeAngular FrequencyAngular Rate SensorAnti-aliasing FilterAttenuateAuto Spectral Density (ASD)Auto Spectrum (Power Spectrum)Auto-rangingAvailabilityAverageAverage RespondingAveragingAxialAxial (Thrust) Position
B
C
- CalibrationCampbell DiagramCavitationChange Review Board (CRB)ChannelCharacterizationCharge AmplifierChatterCircuit CardClassical Shock PulseClosed-loop ControlCoherenceComparisonComplianceComponent Technical Specification (CTS)Condition Monitoring (CM)Constant Percentage FilterConstant-bandwidth FilterContact BounceCrest FactorCritical FrequencyCritical SpeedsCross Spectral DensityCross-axis SensitivityCross-talkCrossover FrequencyCycle
D
- D/A ConverterDampDamperDampingDecadedeciBelDegrees of Freedom (DOF)DependabilityDesign for Assembly (DFA)Design for Manufacturing (DFM)Design LimitDesign Review Based on Test Results (DRBTR)Design RuggedizationDeterministic VibrationDifferential InputsDifferentiationDigital Signal Processor (DSP)DisplacementDistortionDriftDurabilityDurationDUT/UUTDynamic MotionDynamic RangeDynamic Signal Analyzer (DSA)
E
F
- FailureFailure AnalysisFailure EffectFailure MechanismFailure Mode AnalysisFailure Mode and Effects Analysis (FMEA)Failure RateFast Fourier Transform (FFT)Fatigue LifeFaultFeedback SignalFilterFinite Element Modeling/Analysis (FEA)First Order VibrationFixtureForced VibrationForcing FrequencyForcing FunctionFragilityFragility TestFree VibrationFrequencyFrequency RangeFrequency ResponseFrequency SpectrumFundamental FrequencyFundamental Mode
I
J
L
M
- Machinery Health Monitoring (MHM)MagnetostrictionMassMeanMean Time-Between-Failure (MTBF)Mean Time-To-Failure (MTTF)Mechanical FailureMechanical ImpedanceMicro-electromechanical Structures (MEMS)MicronMicrophoneMil (Unit)Mission ProfileMission ReliabilityModal AnalysisModeModulus of Elasticity E (Static)Multiplexer (MUX)
P
- Patent DefectPeakPeak-to-peak valuePerformance-based Requirements (Specifications)PeriodPeriodic VibrationPhasePhase Reference ProbePiezoelectric (PE) TransducerPiezoresistive (PR) TransducerPitchPlastic ReinforcementPlatformPower Spectral Density (PSD)PrecisionProbabilistic VibrationProbability DistributionProbeProof of ScreenProximity Sensor
R
- RadialRandom VibrationRangeRate GyroRattleReal-time Closed-loop ControlRedundancyReliabilityReliability EngineeringRepeatabilityRepetitive Shock MachineReplicationResolutionResonanceResponseResponse SignalRingingRise TimeRMS RespondingRollRolling Element (Anti-Friction) BearingRoot Cause AnalysisRoot Mean Square (RMS)
S
- Sampling RateScreeningSeismicSelf-induced VibrationSensitivitySensorShock MachineShock PulseShock Response Spectrum (SRS)Signal ConditionerSignal-to-Noise Ratio (SNR)Simple Harmonic MotionSingle-ended InputSlew RateSneak Circuit AnalysisSoft FailureSolid-state SensorSoneSoundSound IntensitySound LevelSource FollowerSource ImpedanceSpallSpecificationsSpectral MapSpectrumSpectrum AnalyzerSqueakStandard DeviationStandardsStanding WaveStationaritySteady-state VibrationStep StressingStepped Sine TestingStiffnessStrain-gauge TransducerStressStress ScreeningSub-system Technical Specification (SSTS)SubharmonicSubsynchronousSupply CurrentSwept-Sine TestingSynchronousSynchronous SamplingSystemSystem Effectiveness